Procedures for conducting low-temperature storage tests on digital communication equipment:
Pre-treatment: The test sample should be placed under standard atmospheric conditions for testing until it reaches thermal equilibrium. This ensures that the device is in a stable state before any environmental testing begins.
Initial Testing: Before exposing the device to any environmental stress, it must undergo a series of performance evaluations, including electrical, mechanical, and visual inspections, under normal test conditions. All initial data should be carefully recorded for future comparison.
Test Procedure: The device is then placed into a low-temperature chamber according to the required specifications. The test temperature is typically set to -55°C, unless otherwise specified by the product standards or technical documentation. The duration of the test is 12 hours after the device has reached thermal stability, or as defined in the relevant product specification.
Recovery Phase: After the test, the device is gradually returned to normal atmospheric conditions within the chamber. The rate of temperature change should not exceed 10°C per minute to avoid thermal shock. The device must remain in this environment until it reaches thermal stability again.
Final Testing: Once recovery is complete, the device is retested for its electrical, mechanical, and functional performance, following the same procedures as the initial test. The results are compared with the initial data to determine if any changes or degradation have occurred due to the low-temperature exposure.
Note: These procedures are based on the requirements outlined in GB/T 13543-1992 "Environmental Test Methods for Digital Communication Equipment." It is essential to follow these guidelines to ensure accurate and reliable test outcomes.
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