Digital communication equipment must undergo low temperature storage testing to ensure reliability under extreme conditions. The procedure begins with pretreatment, where the test sample is allowed to reach thermal equilibrium under standard atmospheric conditions. This ensures that the device is in a stable state before any environmental stress is applied.
Before the actual test, an initial assessment is conducted. This includes electrical, mechanical, and functional tests, as well as a visual inspection. All results are recorded for comparison later. These baseline measurements are crucial for evaluating the device’s performance after exposure to low temperatures.
The next step involves placing the test sample in a low temperature chamber. The test conditions typically include a temperature of -55°C, though this may vary depending on the product standard or technical documentation. The device is left in the chamber until it reaches thermal stability, which usually takes about 12 hours. This duration can be adjusted based on specific requirements outlined in the relevant standards.
After the test, the sample is slowly returned to normal atmospheric conditions. The temperature change rate must not exceed 10°C per minute to prevent thermal shock. This recovery phase allows the device to stabilize and return to its original state.
Finally, a post-test evaluation is performed. The device is retested for electrical, mechanical, and other performance characteristics, and the results are compared with the initial data. This helps determine if the device has been affected by the low temperature environment and whether it meets the required specifications.
This entire process follows the guidelines set forth in GB/T 13543-1992, "Environmental Test Methods for Digital Communication Equipment." By following these procedures, manufacturers can ensure their products are durable and reliable in real-world conditions.
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